The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Oct. 05, 2023
Applicant:

Schneider Electric Usa, Inc., Andover, MA (US);

Inventor:

Andi Jakupi, Marion, IA (US);

Assignee:

Schneider Electric USA, Inc., Boston, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/52 (2020.01); H02H 1/00 (2006.01);
U.S. Cl.
CPC ...
G01R 31/52 (2020.01); H02H 1/0015 (2013.01);
Abstract

A method and system are provided for facilitating arc fault detection on an electrical system. In the method and system, a first device can measure or obtain measurements of high frequency signals, on a circuit monitored by a first sensor on the electrical system, which are used to determine high frequency features. A branch device(s) can measure or obtain measurements of low frequency signals, on an associated branch circuit(s) monitored by a second sensor(s), which are used to determine low frequency features on the branch circuit(s). The branch circuit(s) monitored by a second sensor(s) is downstream from the circuit monitored by the first sensor. The high frequency features and the low frequency are used by either the first device or the branch device(s) to detect for an occurrence of an arc fault on the branch circuit(s).


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Jakupi, Andi. (2026). Method and apparatus for smart centralized arc fault detection in a system (U.S. Patent No. 12782463). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12782463

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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