The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Dec. 26, 2024
Applicant:

Panasonic Intellectual Property Management Co., Ltd., Osaka, JP;

Inventors:

Shinichi Machida, Osaka, JP;

Sanshiro Shishido, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/02 (2006.01); G01R 31/26 (2020.01); H01L 21/66 (2006.01); H01L 27/14 (2006.01); H10P 74/20 (2026.01);
U.S. Cl.
CPC ...
G01R 31/2889 (2013.01); G01R 31/2879 (2013.01); H10P 74/207 (2026.01);
Abstract

An inspection method includes: preparing a device that includes a plurality of pixel electrodes, a counter electrode disposed to face the plurality of pixel electrodes, a photoelectric conversion layer disposed between the plurality of pixel electrodes and the counter electrode, a test electrode disposed to face the counter electrode with the photoelectric conversion layer interposed between the counter electrode and the test electrode, a first electrode pad electrically connected to the counter electrode and exposed to an outside of the device, and a second electrode pad electrically connected to the test electrode and exposed to the outside of the device, the test electrode being disposed between two adjacent pixel electrodes of the plurality of pixel electrodes; and measuring a current that flows between the first electrode pad and the second electrode pad by applying a voltage between the first electrode pad and the second electrode pad.


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Machida, Shinichi. (2026). Inspection method and method of manufacturing imaging element (U.S. Patent No. 12782431). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12782431

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