The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

May. 06, 2024
Applicant:

Schneider Electric Usa, Inc., Andover, MA (US);

Inventors:

Jon A Bickel, Murfreesboro, TN (US);

Colton Thomas Peltier, Murfreesboro, TN (US);

Assignee:

SCHNEIDER ELECTRIC USA, INC., Boston, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 19/25 (2006.01); G01R 19/12 (2006.01); G01R 19/14 (2006.01);
U.S. Cl.
CPC ...
G01R 19/2509 (2013.01); G01R 19/12 (2013.01); G01R 19/14 (2013.01); G01R 19/2513 (2013.01);
Abstract

Apparatuses, systems, and methods are provided for automatically identify metering constraints of one or more Intelligent Electronic Devices (IEDs) in an electrical system. An energy-related waveform is captured and electrical measurement data is processed from, or derived from, an energy-related waveform to identify anomalous characteristics in the electrical system. In response to identifying anomalous characteristics in the electrical measurement data, building a model associated with the identified anomalous characteristics, analyzing the model to determine if capture of a (n) energy-related waveform hinders detecting, due to one or more constraints of the a (n) IED. In response to determining the capture of the a energy-related waveform is compromised due to the one or more constraints of a (n) IED, taking action(s) to cause or recommend adjustment of the one or more constraints of a (n) IED at the IED(s) so that the capture of a (n) energy-related waveform does not hinder detection.


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Bickel, Jon. (2026). Systems and methods for improving identification of issues associated with detecting anomalous conditions (U.S. Patent No. 12782400). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12782400

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