Method of automatically testing the sensitivity of a type of dual-crystal ultrasonic probe (also called ultrasonic transducer) and the detection system with the probes

Abstract

An automatic sensitivity testing method for a dual-crystal ultrasonic probe and a flaw detection system does not require a standard test block. An emitter and an echo pole of the dual- crystal ultrasonic probe emit and receive interface waves independently of each other. The wafer of the emitter or the echo pole generates an ultrasonic wave. The end face of the dual-crystal ultrasonic probe performs emission to form an interface wave. The interface wave being received by the wafer generates the ultrasonic wave. Alternatively, the emitter and the echo pole of the dual-crystal ultrasonic probe are in parallel to form an emitting and echo pole. The wafer emitting the echo pole generates ultrasonic waves. The end face of the dual-crystal ultrasonic probe performs emission to form an interface wave, which is received by the wafer emitting the echo pole.