The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12782300 B1

Date of Patent:

Nov. 03, 2026

Filed:

May. 03, 2024

Method and apparatus for using radiation imaging data to analyze components

Applicant:

Rtx Corporation, Farmington, CT (US);

Inventors:

Christopher Pelliccione, Tolland, CT (US);

Iuliana Cernatescu, Glastonbury, CT (US);

Robert Koch, Hartford, CT (US);

David Furrer, Marlborough, CT (US);

Ryan Breneman, Newington, CT (US);

Assignee:

RTX CORPORATION, Farmington, CT (US);

Attorney:

Carlson, Gaskey & Olds, P.C.

Primary Examiner:

Michael Maskell

Int. Cl.

CPC ...

G01N 23/203 (2006.01); G01N 23/04 (2018.01); G01N 23/16 (2018.01);

U.S. Cl.

CPC ...

G01N 23/203 (2013.01); G01N 23/04 (2013.01); G01N 23/16 (2013.01);

Abstract

An example system for analyzing a component includes a radiation source configured to transmit an input radiation beam towards a component, at least a portion of the input radiation beam passing through the component as an output beam pattern; a radiation detector configured to detect the output beam pattern; and a beam adjustment device disposed between the radiation source and the component and configured to modify a radiation intensity profile of the input radiation beam, wherein the beam adjustment device has an adjustable radiation transparency. A method of analyzing a component is also disclosed, which includes transmitting an input radiation beam from a radiation source towards a component, at least a portion of the input radiation beam passing through the component as an output beam pattern; modifying a radiation intensity profile of the input radiation beam by passing the input radiation beam through a beam adjustment device disposed between the radiation source and the component, wherein the beam adjustment has an adjustable radiation transparency; and detecting the output beam pattern at a radiation detector.

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Pelliccione, Christopher. (2026). Method and apparatus for using radiation imaging data to analyze components (U.S. Patent No. 12782300). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12782300

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