The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Jun. 29, 2023
Applicant:

Yinwang Intelligent Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Wenkai Fei, Beijing, CN;

Jianqin Liu, Beijing, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05D 1/00 (2024.01); G01C 21/00 (2006.01); G06F 18/23213 (2023.01);
U.S. Cl.
CPC ...
G01C 21/3807 (2020.08); G06F 18/23213 (2023.01);
Abstract

A high-definition map update method includes obtaining n-dimensional feature information of a dynamic event in n dimensions, where the n dimensions are n factors that affect representation of the dynamic event in a high-definition map, the dynamic event is an event that causes dynamic information in the high-definition map to change, and n is an integer greater than one, and determining, based on the feature information, a representation manner of the dynamic event in the high-definition map, where the representation manner includes at least one of an extended attribute representation manner or a dynamic layer representation manner.


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Fei, Wenkai. (2026). High-definition map update method and apparatus (U.S. Patent No. 12782157). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12782157

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