The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Dec. 19, 2024
Applicant:

Konica Minolta, Inc., Tokyo, JP;

Inventors:

Masayuki Iijima, Okazaki, JP;

Sotaro Yokota, Fuchu, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/521 (2017.01); G01B 11/25 (2006.01);
U.S. Cl.
CPC ...
G01B 11/254 (2013.01); G06T 7/521 (2017.01);
Abstract

A three-dimensional shape measurement apparatus includes a projector that includes a projector lens and projects a stripe pattern, a camera that includes a camera lens and captures an image of the stripe pattern projected by the projector to acquire the captured image of the stripe pattern, and a hardware processor. The hardware processor measures a three-dimensional shape of a measurement target based on the captured image. The hardware processor determines, from a plurality of cycle candidates, a cycle of a stripe pattern to be projected by the projector. The plurality of cycle candidates are set based on a synthetic MTF characteristic generated by combining a first MTF characteristic of the projector lens and a second MTF characteristic of the camera lens.


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Iijima, Masayuki. (2026). Three-dimensional shape measurement apparatus and measurement method, and non-transitory computer-readable recording medium (U.S. Patent No. 12782122). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12782122

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