The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2026
Filed:
Apr. 19, 2022
Applicant:
Nikon Corporation, Tokyo, JP;
Inventors:
Eric Peter Goodwin, Oro Valley, AZ (US);
Goldie Lynne Goldstein, Oro Valley, AZ (US);
Assignee:
Nikon Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01); G01B 9/02001 (2022.01); G01B 11/06 (2006.01); G01B 11/30 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2441 (2013.01); G01B 9/02007 (2013.01); G01B 11/0608 (2013.01); G01B 11/303 (2013.01); G01B 2290/70 (2013.01);
Abstract
The problem of measuring height properties (for instance, for aspheric optical components) is addressed by systems and methods that employ heterodyne optical interferometry to detect a plurality of interference patterns corresponding to a plurality of orientations of the surface and that determine a height property (such as a mid-spatial frequency spectrum or topography) of the surface from the plurality of interference patterns.
Quick Actions:
Goodwin, Eric. (2026). Systems and methods for measuring height properties of surfaces (U.S. Patent No. 12782118). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12782118
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile