The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2026
Filed:
Jun. 20, 2024
Optipro Systems, Llc, Ontario, NY (US);
James F. Munro, Ontario, NY (US);
Robert D. Niederriter, Albany, CA (US);
Munro Design & Technologies, LLC, Ontario, NY (US);
Abstract
An interferometer system for measuring the displacement of a location of a test surface includes a reference arm comprising two reflective optical elements with optical power, a measurement arm comprising two reflective optical elements with optical power wherein one of the optical elements of the reference arm is one of the optical elements of the measurement arm. A housing can be provided in which the reflective optical elements are mounted, all such components made from a material having a low CTE. Further, spider support structures can be provided for positioning a reflective optical element within the housing, and/or for positioning a fiber optic device within the system. Light detecting elements can be installed on a side of a spider support structure facing the test surface and used to detect a tilt of the test surface which can be used to improve the accuracy of the displacement measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile