The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Mar. 25, 2022
Applicant:

Tokyo Keiki Inc., Tokyo, JP;

Inventors:

Takayoshi Yamaguchi, Tokyo, JP;

Kazuaki Tani, Tokyo, JP;

Assignee:

Tokyo Keiki Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B81C 1/00 (2006.01); G01C 19/5691 (2012.01); G01C 19/5783 (2012.01);
U.S. Cl.
CPC ...
B81C 1/00166 (2013.01); B81C 1/00134 (2013.01); B81C 1/00158 (2013.01); B81C 1/00182 (2013.01); B81C 1/00269 (2013.01); B81C 1/00357 (2013.01); B81B 2201/0242 (2013.01); G01C 19/5691 (2013.01); G01C 19/5783 (2013.01);
Abstract

One embodiment comprises: forming an annular recess on an upper surface of a lower wafer, and a stem having a tip higher than at a radially-outer-surface a generally center of the recess; forming first electrodes arranged on the radially-outer-surface; forming a sacrificial layer; forming second electrodes arranged on a bottom surface of an upper wafer; bonding the upper wafer and the lower wafer with the sacrificial layer in between; separating a radially outer portion, which is located at a radially outer side of the upper wafer relative to the second electrodes; vacuum heating the upper wafer, the lower wafer, and the sacrificial layer under a condition where a pressure in a cavity defined by the upper wafer, the lower wafer, and the sacrificial layer is different from an ambient pressure; and removing the sacrificial layer after the vacuum heating at the pressure different from the ambient pressure.


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Yamaguchi, Takayoshi. (2026). Method for manufacturing curved surface support structure, and hemispherical resonator gyroscope (U.S. Patent No. 12780651). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12780651

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