The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 03, 2026
Filed:
Mar. 13, 2023
GM Global Technology Operations Llc, Detroit, MI (US);
Texas Tech University, Lubbock, TX (US);
Dennis J. Carroll, Leander, TX (US);
Charles Alvin Wiley, Austin, TX (US);
Sai Rohit Kumar Danda, Dublin, IE;
Vikram Jeet, Greystones, IE;
Paerhati Remutula, Limerick, IE;
Kegan Austin Clark, Lake St. Louis, MO (US);
Micheal Morrow, St. Peters, MO (US);
David Gutman, Lubbock, TX (US);
Allan Gurwicz, Lubbock, TX (US);
George Fernandes, Lubbock, TX (US);
GM GLOBAL TECHNOLOGY OPERATIONS LLC, Detroit, MI (US);
TEXAS TECH UNIVERSITY, Lubbock, TX (US);
Abstract
A system includes a module configured to, for each footprint of a conveyor, identify vehicle groups having different vehicle characteristics and over-cycle distributions for each vehicle group or a back-to-back sequence of any given vehicle group by calculating, for each vehicle characteristic, over-cycle distributions for a first vehicle group having the vehicle characteristic and a second vehicle group not having the vehicle characteristic, determining whether either the number of vehicles in the first or second vehicle group or a difference between the over-cycle distributions for the first and second vehicle groups satisfies a threshold condition, and in response, cease identifying the vehicle groups. The module is configured to identify, for a received actual vehicle sequence, over-cycle risks based on the identified vehicle groups and the over-cycle distributions for each vehicle group or a back-to-back sequence of any given vehicle group. Other examples systems and methods are also disclosed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile