The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Sep. 28, 2023
Applicant:

Yamazaki Mazak Corporation, Niwa-gun, JP;

Inventors:

Kazuya Horibe, Niwa-gun, JP;

Osamu Aoyama, Niwa-gun, JP;

Yukihiko Saga, Niwa-gun, JP;

Hiromasa Yamamoto, Niwa-gun, JP;

Hyunkoo Park, Niwa-gun, JP;

Jumpei Kitayama, Niwa-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B23Q 17/09 (2006.01); B23Q 17/12 (2006.01); G05B 19/406 (2006.01); G05B 19/414 (2006.01); G05B 23/02 (2006.01);
U.S. Cl.
CPC ...
B23Q 17/0971 (2013.01); B23Q 17/12 (2013.01); G05B 19/406 (2013.01); G05B 19/4145 (2013.01); G05B 23/0221 (2013.01); G05B 2223/06 (2018.08);
Abstract

A machine tool includes an input interface configured to receive an instruction, an actuator configured to actuate, control circuitry configured to control an actuation of the actuator based on the instruction, a component having a physical state to be affected by the actuation, a sensor configured to detect the physical state, and a computer connected to the control circuitry via an external communication interface. The computer is configured to receive a signal from the sensor, generate, based on the signal, rough state-description data relevant to an occurrence of an abnormality in the component, transmit the rough state-description data to the control circuitry, generate detailed state-description data based on the signal, the detailed state-description data being more informative than the rough state-description data such that the detailed state-description data facilitates identifying an abnormal part in the component, and transmit the detailed state-description data to a monitoring computer via a communication network.


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Horibe, Kazuya. (2026). Machine tool, diagnosis system for machine tool, and method of diagnosing machine tool (U.S. Patent No. 12779613). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12779613

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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