The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 03, 2026

Filed:

Aug. 29, 2022
Applicant:

Duke University, Durham, NC (US);

Inventors:

Joanne C. Wen, Durham, NC (US);

Erin Simons, Cary, NC (US);

Scott Liddle, Cary, NC (US);

Assignee:

Duke University, Durham, NC (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/00 (2006.01); A61B 3/14 (2006.01); A61B 3/16 (2006.01);
U.S. Cl.
CPC ...
A61B 3/16 (2013.01); A61B 3/14 (2013.01);
Abstract

Systems, devices, and methods for measuring intraocular pressure of the eye are disclosed. More particularly, the improved systems, devices, and methods enable the use of applanation tonometry and tonography to make such measurements using a portable, handheld applanation device. The applanation devices apply a constant fixed force to the surface of the eye. The resulting applanation mire can be captured by an image-capturing device and the intraocular pressure can be calculated using a provided algorithm based on the applanation mire and a known reference with respect to the eye.


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Wen, Joanne. (2026). Systems and methods for applanation tonometry and tonography (U.S. Patent No. 12778420). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12778420

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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