The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Sep. 21, 2023
Applicant:

Mitsubishi Electric Corporation, Tokyo, JP;

Inventors:

Masayuki Nishiyama, Tokyo, JP;

Naoki Yoshimatsu, Tokyo, JP;

Rei Yoneyama, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H10P 72/00 (2026.01); B23K 26/402 (2014.01); B23K 26/53 (2014.01); B23K 101/40 (2006.01); H10P 34/42 (2026.01); H10W 40/20 (2026.01); H10W 70/04 (2026.01); H10W 70/40 (2026.01); H10W 72/00 (2026.01); H10W 72/50 (2026.01);
U.S. Cl.
CPC ...
H10P 72/0441 (2026.01); B23K 26/402 (2013.01); B23K 26/53 (2015.10); H10P 34/42 (2026.01); H10W 40/231 (2026.01); H10W 40/235 (2026.01); H10W 70/041 (2026.01); H10W 70/442 (2026.01); H10W 72/075 (2026.01); H10W 72/50 (2026.01); B23K 2101/40 (2018.08);
Abstract

A semiconductor manufacturing apparatus of the present disclosure includes a semiconductor module having a semiconductor device, a sealing material adapted to seal the semiconductor module, and a second terminal to be arranged outside the sealing material. The semiconductor module includes a first terminal electrically connected to the semiconductor device and extending to the outside of the sealing material. The first terminal is joined to the second terminal outside the sealing material. The thickness of the second terminal in a direction perpendicular to a joined face of the first terminal and the second terminal is defined as the thickness of the second terminal. The thickness of the first terminal at a portion extending from the sealing material in the direction perpendicular to the joined face is defined as the thickness of the first terminal. The thickness of the second terminal is greater than the thickness of the first terminal.


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Nishiyama, Masayuki. (2026). Semiconductor manufacturing apparatus and method for manufacturing a semiconductor manufacturing apparatus (U.S. Patent No. 12777877). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12777877

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