The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Oct. 28, 2024
Applicant:

Intel Products Ip Llc, Santa Clara, CA (US);

Inventor:

Yizhi Yao, Chandler, AZ (US);

Assignee:

Intel Products IP LLC, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 28/02 (2009.01); H04L 43/08 (2022.01);
U.S. Cl.
CPC ...
H04W 28/0268 (2013.01); H04L 43/08 (2013.01);
Abstract

An apparatus and method for measuring per Quality of Service (QOS) flow per user equipment (UE) for one-way delay between a Packet Data Unit (PDU) Session Anchor User Plane Function (PSA UPF) and a UE in 5G networks. The integrated downlink (DL) and uplink (UL) UE level delay measurements are generated and provided. The UE level delay measurements include average DL/UL packet delays, both excluding and including D1 UL Packet Data Convergence Protocol (PDCP) delay, calculated using timestamps from General Packet Radio System (GPRS) Tunnelling Protocol (GTP) packet data unit (PDU) monitoring response packets.


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Yao, Yizhi. (2026). Per qos flow per ue measurements on one way delay between psf upf and ue (U.S. Patent No. 12777364). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12777364

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