The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Jun. 12, 2023
Applicant:

Guangdong Oppo Mobile Telecommunications Corp., Ltd., Dongguan, CN;

Inventors:

Shukun Wang, Dongguan, CN;

Rongyi Hu, Dongguan, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04W 72/0453 (2023.01); H04W 24/08 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04W 72/0453 (2013.01);
Abstract

A method and apparatus for determining a measurement gap, and a non-transitory computer-readable storage medium are provided. The method comprises: determining, by a terminal device, that switching from a BWP to a target BWP is triggered, switching of the source BWP being associated with a first measurement gap configuration, and the target BWP being associated with a second measurement gap configuration; and determining, by the terminal device, an activated or enabled measurement gap configuration from the first measurement gap configuration and the second measurement gap configuration, and performing measurement using the activated or enabled measurement gap configuration.


Find Patent Forward Citations

Quick Actions:

Wang, Shukun. (2026). Method and apparatus for determining measurement gap, and terminal device (U.S. Patent No. 12777348). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12777348

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…