The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Apr. 18, 2022
Applicant:

Beijing Xiaomi Mobile Software Co., Ltd., Beijing, CN;

Inventor:

Xing Yang, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 43/062 (2022.01); H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04L 43/062 (2013.01); H04W 24/10 (2013.01);
Abstract

A measurement configuration processing method includes: receiving, by a terminal device, measurement configuration information sent by a network-side, where the measurement configuration information includes a quantity configuration; and determining a target access technology corresponding to the quantity configuration and a target measurement index identifier corresponding to the target access technology; and performing at least one of the following: deleting stored report information corresponding to the target measurement index identifier, or stopping the running of a report timer corresponding to the target measurement index identifier.


Find Patent Forward Citations

Yang, Xing. (2026). Measurement configuration processing method, and apparatus (U.S. Patent No. 12776973). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12776973

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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