The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Jan. 11, 2022
Applicant:

Nokia Technologies Oy, Espoo, FI;

Inventors:

Jing Yuan Sun, Beijing, CN;

Mads Lauridsen, Aalborg, DK;

Tzu-Chung Hsieh, Naperville, IL (US);

Frank Frederiksen, Aalborg, DK;

Gilsoo Lee, Naperville, IL (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 1/00 (2006.01); H04L 27/26 (2006.01); H04W 84/06 (2009.01);
U.S. Cl.
CPC ...
H04L 1/0069 (2013.01); H04L 27/26025 (2021.01); H04W 84/06 (2013.01);
Abstract

Embodiments of the present disclosure relate to devices, methods, apparatuses and computer-readable storage medium for symbol puncturing in segment processing. In some example embodiments, a first determines a puncturing pattern for one or more segments for performing puncturing, the puncturing pattern indicating at least one segment of the one or more segments to be punctured. The first device further performs puncturing on the one or more segments based on the puncturing pattern and transmits the one or more segments to the second device.


Find Patent Forward Citations

Sun, Jing. (2026). Puncturing in segment processing (U.S. Patent No. 12776857). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12776857

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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