The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Dec. 16, 2021
Applicant:

Ntt, Inc., Tokyo, JP;

Inventors:

Kazuya Anazawa, Musashino, JP;

Toru Mano, Musashino, JP;

Kei Kitamura, Musashino, JP;

Yoshiaki Sone, Musashino, JP;

Hideki Nishizawa, Musashino, JP;

Assignee:

NTT, Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/079 (2013.01);
U.S. Cl.
CPC ...
H04B 10/07953 (2013.01);
Abstract

A measurement apparatus includes a creation unit that creates a table in which a value of repeatedly applied electrical noise is associated with a bit error rate occurring at the time of application of the electrical noise in an optical transmission and reception module for transmitting a bit string to itself in a predetermined transmission mode, and an estimation unit that estimates and calculates an actual device noise curve of the optical transmission and reception module, calculates a theoretical noise curve of the optical transmission and reception module using a theoretical equation for the transmission mode, estimates and calculates a noise amount of the optical transmission and reception module from a deviation between the actual device noise curve and the theoretical noise curve, and estimates and calculates optical transmission and reception characteristics of the optical transmission and reception module as actual device characteristics using the noise amount.


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Anazawa, Kazuya. (2026). Measurement apparatus, management system, and measurement method (U.S. Patent No. 12776838). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12776838

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