The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Nov. 28, 2023
Applicants:

Shunsuke Kudo, Kanagawa, JP;

Waka Lin, Tokyo, JP;

Shusaku Shiomoto, Kanagawa, JP;

Inventors:

Shunsuke Kudo, Kanagawa, JP;

Waka Lin, Tokyo, JP;

Shusaku Shiomoto, Kanagawa, JP;

Assignee:

RICOH COMPANY, LTD., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 10/30 (2022.01); G06T 11/10 (2026.01); G06V 10/20 (2022.01); G06V 10/774 (2022.01);
U.S. Cl.
CPC ...
G06V 10/30 (2022.01); G06T 11/10 (2026.01); G06V 10/255 (2022.01); G06V 10/774 (2022.01); G06V 2201/07 (2022.01);
Abstract

A detection system includes a learning apparatus and a detection apparatus. The learning apparatus has a first preprocessing unit that extracts, from a captured image used for training, which includes a noise image and an image of an object having a detection target, a training image, based on a structure around the detection target, and a training unit that trains a machine learning model based on the training image. The detection apparatus has an acquisition unit that acquires the machine learning model, a second preprocessing unit that extracts, from a captured image used for detection, which includes the noise image and the image of the object, candidates for being the detection target image, based on the structure around the detection target, and a detection unit that detects a detection target image from among the detection target image candidates, by using the machine learning model.


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Kudo, Shunsuke. (2026). Detection system, detection apparatus, learning apparatus, detection method, learning method and program (U.S. Patent No. 12776119). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12776119

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