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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12776050 B1

PDFFull Text
Date of Patent:
Oct. 27, 2026

Filed:

Jan. 18, 2023

Method and an apparatus for improving depth calculation

Applicant:

Inuitive Ltd., Ra'anana, IL;

Inventors:

Edward Elikhis, Ra'anana, IL;

Dor Peretz, Kfar Saba, IL;

Assignee:

INUITIVE LTD., Ra'Anana, IL;

Attorneys:

FisherBroyles, LLP

Roger L. Browdy

Ronni S. Jillions

Primary Examiner:

Jayesh A Patel

Int. Cl.
CPC ...
G06K 9/00 (2022.01); G06T 7/50 (2017.01); G06V 10/25 (2022.01); G06V 10/74 (2022.01);
U.S. Cl.
CPC ...
G06T 7/50 (2017.01); G06V 10/25 (2022.01); G06V 10/761 (2022.01);
Abstract

A computational platform and a method for use in a depth calculation process based on information comprised in an image captured by one or more image capturing sensors, wherein the computational platform enables distinguishing between areas included in the captured image that comprise details that are implementable by a matching algorithm and areas that do not have such details, wherein the computational platform comprises at least one processor, configured to select at least one matching window comprised in the captured image for matching a corresponding part included in each image captured by the one or more image capturing devices; calculate a metric based on a respective selected matching window; and calculate a depth map based on the calculated metric associated with the at least one matching window.

Find Patent Forward Citations

Elikhis, Edward. (2026). Method and an apparatus for improving depth calculation (U.S. Patent No. 12776050). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12776050

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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