The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Feb. 15, 2022
Applicant:

Ntt, Inc., Tokyo, JP;

Inventors:

Nobukazu Fukuda, Musashino, JP;

Chao Wu, Musashino, JP;

Shingo Horiuchi, Musashino, JP;

Hiroaki Kikushima, Musashino, JP;

Kenichi Tayama, Musashino, JP;

Assignee:

NTT, Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 40/226 (2020.01); G06F 40/253 (2020.01); G06F 40/284 (2020.01); G06F 40/30 (2020.01);
U.S. Cl.
CPC ...
G06F 40/226 (2020.01); G06F 40/253 (2020.01); G06F 40/284 (2020.01); G06F 40/30 (2020.01);
Abstract

A validity determination apparatus according to one embodiment includes: circuitry configured to acquire a natural sentence; output a semantic representation by executing semantic parsing with the natural sentence as an input; calculate a first alignment score representing a relationship between input/output tokens of the natural sentence and the semantic representation; calculate a second alignment score of a word unit from a relationship between a token included in the input/output tokens and a word; extract natural sentence content words by executing part-of-speech parsing on the natural sentence; a grammar parser configured to extract semantic representation content words by executing grammar parsing on the semantic representation; and determine whether the semantic representation is valid on the basis of the second alignment score, the natural sentence content words, and the semantic representation content words.


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Fukuda, Nobukazu. (2026). Validity determination apparatus, validity determination method, and validity determination program (U.S. Patent No. 12775792). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12775792

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