The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2026
Filed:
Feb. 06, 2025
Honeywell International Inc., Charlotte, NC (US);
Kenneth H. Heffner, Largo, FL (US);
James L. Tucker, Clearwater, FL (US);
Honeywell Aerospace US LLC, Phoenix, AZ (US);
Abstract
A method for determining whether data on a device has changed from an original version of the data ('the original data') is provided. The method comprising: converting the data to a first three-dimensional (3D) spatial representation of the data, wherein the first 3D spatial representation represents multiple characteristics of the data using a position of a point and/or vacancy in the first 3D spatial representation; wherein converting the data to the first 3D spatial representation comprises converting the data using a same process used to generate a second 3D spatial representation from the original data; analyzing the first 3D spatial representation using one or more spatial processes; and determining whether the data has changed based on the analysis of the first 3D spatial representation.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile