The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2026
Filed:
Jan. 10, 2025
Fulian Precision Electronics (Tianjin) Co., Ltd., Tianjin, CN;
Fulian Precision Electronics (Tianjin) Co., LTD., Tianjin, CN;
Abstract
A method of generating a test sequence includes: obtaining several test items of an ECU, and obtaining a dependency relationship and an exclusive situation relationship among the test items; outputting the test items to a test monitor device; receiving test resources required by each of the test items, which are obtained by the test monitor device; generating a test sequence based on the dependency relationship, the exclusive situation relationship, and the test resources required by each of the test items; outputting the test sequence to a test execution device. The test sequence indicates an execution timestamp of each test item, which indicates an execution starting time. The test execution device executes the test items based on the test sequence. A total execution time duration of testing is significantly reduced. An utilization rate of test resources and the efficiency of test are improved. A test system is also provided.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile