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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12775535 B1

PDFFull Text
Date of Patent:
Oct. 27, 2026

Filed:

Apr. 05, 2023

Ser-des test chip and method for managing inter-operability data rate range

Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Nageswara Rao Kunchapu, Bengaluru, IN;

Praveen S Bharadwaj, Bengaluru, IN;

Somasunder Kattepura Sreenath, Bengaluru, IN;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Suwon-si, KR;

Attorney:

Sughrue Mion, PLLC

Primary Examiner:

Omar J Ghowrwal

Assistant Examiner:

Sanaa undefined Al Samahi

Int. Cl.
CPC ...
G06F 11/22 (2006.01); G01R 31/3177 (2006.01); G01R 31/3185 (2006.01); G06F 11/273 (2006.01); H04J 3/04 (2006.01); H04L 47/10 (2022.01); H04L 47/30 (2022.01); H04L 67/1097 (2022.01);
U.S. Cl.
CPC ...
G06F 11/2221 (2013.01); G01R 31/3177 (2013.01); G01R 31/318572 (2013.01); G01R 31/318583 (2013.01); G06F 11/2273 (2013.01); G06F 11/2736 (2013.01); H04J 3/04 (2013.01); H04L 47/10 (2013.01); H04L 47/30 (2013.01); H04L 67/1097 (2013.01);
Abstract

There is provided a method for managing the inter-operability data rate range of serializer/deserializer (Ser-Des) test chips. The method doubles the inter-operability data rate range of the Ser-Des test chip, reduces the skew on data pins, and thereby increases the performance in the inter-operability test of the Ser-Des test chip.

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Kunchapu, Nageswara. (2026). Ser-des test chip and method for managing inter-operability data rate range (U.S. Patent No. 12775535). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12775535

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