The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Sep. 22, 2022
Applicant:

Ppg Industries Ohio, Inc., Cleveland, OH (US);

Inventors:

Christian J. Decker, Wadsworth, OH (US);

Timothy M. Vrabel, Pittsburgh, PA (US);

John W. Walker, Pittsburgh, PA (US);

Eric E. Gurinowitsch, Beaver Falls, PA (US);

Charles J. Beyer, New Kensington, PA (US);

Edward S. Pagac, Metamora, MI (US);

Steven P. Phillips, Toledo, OH (US);

Brian V. Yordnoff, Pittsburgh, PA (US);

Assignee:

PPG Industries Ohio, Inc., Cleveland, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/04845 (2022.01); B05C 11/00 (2006.01); G06F 3/0482 (2013.01);
U.S. Cl.
CPC ...
G06F 3/04845 (2013.01); B05C 11/00 (2013.01); G06F 3/0482 (2013.01);
Abstract

A computer-implemented method can include identifying and tracking defects that arise in the operation of painting vehicles through a graphical user interface that enables display of a cumulative 'heat map.' Computerized systems may employ methods for displaying a modeled vehicle, alongside various vehicle attributes, containing the identified defects. The defects can be sorted, identified, and/or grouped by type, location, where and when in the process the defect occurs, or other relevant defect or vehicular information. When the modeled vehicle is displayed, the variety of defects will be displayed and can easily be identified, for example, by using designated colors for each defect. The variety of defects may be overlaid on the modeled vehicle to provide a “heat map.” showing areas of high defect concentration and areas of low defect concentration. Such methods may be implemented, for example, in an application.


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Decker, Christian. (2026). Systems, methods, and interfaces for tracking defects (U.S. Patent No. 12775372). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12775372

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