The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2026
Filed:
Oct. 11, 2023
Fujifilm Corporation, Tokyo, JP;
Haruka Ikeda, Tokyo, JP;
FUJIFILM Corporation, Tokyo, JP;
Abstract
A processor of a manufacturing line abnormality portent detection apparatus acquires an image obtained by imaging a product manufactured by a manufacturing line using a radiography apparatus for each product, and acquires significant point information related to a significant point of the product based on the acquired image. The processor stores information that affects a determination of presence or absence of a defect of the product as defect related information and information that does not affect the determination of the presence or absence of the defect of the product as defect unrelated information, among pieces of the significant point information, in a memory. The processor calculates a line evaluation value indicating a soundness degree of the manufacturing line based on the defect related information and the defect unrelated information, and detects an abnormality sign of the manufacturing line based on the calculated line evaluation value.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile