The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Apr. 06, 2023
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Moojoon Shin, Suwon-si, KR;

Sooyong Lee, Suwon-si, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 1/36 (2012.01); G03F 1/44 (2012.01); G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
G03F 1/36 (2013.01); G03F 1/44 (2013.01); G03F 7/70425 (2013.01); G03F 7/705 (2013.01);
Abstract

An optical proximity correction (OPC) method using a Jacobian matrix, which may minimize an edge placement error (EPE) of an arbitrary pattern, and a method of manufacturing a mask by using the OPC method. The OPC method may include obtaining training data for calculating a differentiation Jacobian matrix of a mask segment of an EPE, obtaining a neural Jacobian matrix model through artificial neural network (ANN) training using the training data, and applying a prediction value based on the neural Jacobian matrix model to mask optimization (MO) to minimize the EPE.


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Shin, Moojoon. (2026). Optical proximity correction method using neural jacobian matrix and method of manufacturing mask by using the optical proximity correction method (U.S. Patent No. 12775207). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12775207

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