The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Apr. 23, 2024
Applicant:

Siemens Healthineers Ag, Forchheim, DE;

Inventors:

Thomas Allmendinger, Forchheim, DE;

Markus Juergens, Adelsdorf, DE;

Alexander Ziegler, Eggolsheim, DE;

Patrick Wohlfahrt, Erlangen, DE;

Assignee:

Siemens Healthineers AG, Forchheim, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/29 (2006.01); G01T 1/36 (2006.01);
U.S. Cl.
CPC ...
G01T 1/2992 (2013.01); G01T 1/2985 (2013.01); G01T 1/366 (2013.01);
Abstract

An X-ray system for acquiring projection measurement data of an examination object comprises: an X-ray emitter arrangement having an X-ray radiation source to emit X-rays; and a photon-counting X-ray detector with at least one detection threshold for spectrally resolved detection of the X-rays. The at least one detection threshold is variable spatially and/or temporally in a same measurement.


Find Patent Forward Citations

Allmendinger, Thomas. (2026). Spectrally resolved x-ray imaging (U.S. Patent No. 12775110). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12775110

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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