The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Nov. 09, 2022
Applicant:

Cj Cheiljedang Corporation, Seoul, KR;

Inventors:

Joo Hee Lim, Seoul, KR;

Sang-Eui Choi, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 33/02 (2006.01); G01N 3/06 (2006.01); G01N 3/42 (2006.01);
U.S. Cl.
CPC ...
G01N 33/02 (2013.01); G01N 3/066 (2013.01); G01N 3/42 (2013.01);
Abstract

The present invention relates to a food texture measuring apparatus and a food texture measuring method, and more specifically to a food texture measuring apparatus which is capable of simultaneously measuring texture patterns of a subject and capable of measuring texture according to the size and shape of the subject.


Find Patent Forward Citations

Lim, Joo. (2026). Food texture measuring apparatus and food texture measuring method (U.S. Patent No. 12774998). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12774998

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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