The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2026
Filed:
Nov. 29, 2024
Pratt & Whitney Canada Corp., Longueuil, CA;
Guy Joel Rocher, Mont-Royal, CA;
PRATT & WHITNEY CANADA CORP., Longueuil, CA;
Abstract
Systems and methods for non-destructive evaluation of components using computed tomography and infrared thermography are provided. A method includes acquiring, using X-ray computed tomography, a digital three-dimensional representation of the component, and identifying a region of the component containing the defect from the digital three-dimensional representation of the component. The component is mechanically excited to induce a thermal response in the region of the component containing the defect. A thermographic image of the region of the component containing the defect is acquired with an infrared sensor while the thermal response is exhibited. The component is evaluated using the thermographic image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile