The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2026
Filed:
Oct. 06, 2022
Applicant:
Mitsubishi Heavy Industries, Ltd., Tokyo, JP;
Inventors:
Hiroshi Makigano, Tokyo, JP;
Ryuta Ito, Tokyo, JP;
Atsuya Sakata, Tokyo, JP;
Taro Tokutake, Tokyo, JP;
Assignee:
MITSUBISHI HEAVY INDUSTRIES, LTD., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 3/00 (2006.01); F01D 5/18 (2006.01); G01J 5/48 (2022.01); G01M 13/00 (2019.01); G01M 13/02 (2019.01); G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01M 13/02 (2013.01); G01J 5/485 (2022.01); G01M 99/002 (2013.01);
Abstract
A component inspection method includes: supplying a fluid to a cooling flow passage of a component internally including the cooling flow passage; heating a surface of the component; and measuring a temperature of the surface of the component which has been heated.
Quick Actions:
Makigano, Hiroshi. (2026). Component inspection method, component manufacturing method, and component inspection device (U.S. Patent No. 12774937). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12774937
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile