The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 2026
Filed:
Jan. 03, 2023
Ciena Corporation, Hanover, MD (US);
Yinqing Pei, Kanata, CA;
Ciena Corporation, Fulton, MD (US);
Abstract
Optical Time Domain Reflectometer (OTDR) trace monitoring for change of fiber and Raman gain profile with Raman amplification uses Machine Learning. The OTDR trace monitoring includes obtaining data associated with a plurality of Optical Time Domain Reflectometer (OTDR) traces each performed at a different time; responsive to changes between the plurality of OTDR traces being above a threshold, analyzing the changes between the plurality of OTDR traces with a trained machine learning model; and determining an impact factor based on the machine learning model, wherein the impact factor is a classification of the changes between the plurality of OTDR traces.
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