logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12774928 B1

PDFFull Text
Date of Patent:
Oct. 27, 2026

Filed:

Oct. 04, 2023

Systems and methods for monitoring the surface temperature of an object using the temperature-dependent absorption properties of semiconductors

Applicants:

California Institute of Technology, Pasadena, CA (US);

Totalenergies Onetech, Courbevoie, FR;

Inventors:

Axel Scherer, Barnard, VT (US);

Jack Jewell, Boulder, CO (US);

John Richard Ordonez-Varela, Lescar, FR;

Paromita Mitchell, Pasadena, CA (US);

Assignees:

CALIFORNIA INSTITUTE OF TECHNOLOGY, Pasadena, CA (US);

TOTALENERGIES ONETECH, Courbevoie, FR;

Attorney:

Kaplan Breyer Schwarz, LLP

Primary Examiner:

Peter J Macchiarolo

Assistant Examiner:

Mireille S Sadate-Moualeu

Int. Cl.
CPC ...
G01K 11/125 (2021.01);
U.S. Cl.
CPC ...
G01K 11/125 (2013.01);
Abstract

A temperature monitoring system includes a semiconductor member mounted onto the surface of an object having a surface whose temperature is to be monitored. The semiconductor member has a temperature-dependent bandgap with an absorption edge that varies with temperature. A light source is configured to illuminate the semiconductor member with monochromatic light. The monochromatic light has a wavelength equal to an absorption edge wavelength that is associated with the absorption edge when the semiconductor member is at a specified temperature. A detector is configured to receive light reflected from the semiconductor member when illuminated with the monochromatic light such that a surface temperature of the object is at the specified temperature when a change in an amount of reflected light that is received indicates that the wavelength of the monochromatic light is equal to the absorption edge wavelength at the specified temperature.

Find Patent Forward Citations

Quick Actions:

Scherer, Axel. (2026). Systems and methods for monitoring the surface temperature of an object using the temperature-dependent absorption properties of semiconductors (U.S. Patent No. 12774928). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12774928

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…