The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Nov. 06, 2023
Applicant:

Lockheed Martin Corporation, Bethesda, MD (US);

Inventor:

Kurt M. Chankaya, Keller, TX (US);

Assignee:

Lockheed Martin Corporation, Bethesda, MD (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 21/00 (2006.01);
U.S. Cl.
CPC ...
G01C 21/005 (2013.01);
Abstract

A method for identifying a precise localization and mapping of an altitudinal system with respect to dynamic surfaces is presented. The method includes receiving a time-dependent map of a patch of a dynamic surface. The time-dependent map is captured by a first altitudinal system having a known location with respect to the dynamic surface. The method includes receiving a terrain map of a first set of terrain features of the patch of the dynamic surface. The terrain map is captured by a second altitudinal system having an approximate location with respect to the dynamic surface. The method includes comparing the first set of terrain features to a second set of terrain features stored in a database, and identifying, based on the comparison of the first set of terrain features and the second set of terrain features, a precise location of the second altitudinal system with respect to the dynamic surface.


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Chankaya, Kurt. (2026). Precise localization and mapping of altitudinal systems over dynamic surfaces (U.S. Patent No. 12774888). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12774888

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