The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 2026

Filed:

Sep. 20, 2022
Applicant:

Topcon Corporation, Tokyo-to, JP;

Inventor:

Taichi Yuasa, Tokyo-to, JP;

Assignee:

TOPCON CORPORATION, Tokyo-to, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01C 15/00 (2006.01); G01C 15/06 (2006.01);
U.S. Cl.
CPC ...
G01C 15/006 (2013.01); G01C 15/06 (2013.01);
Abstract

A surveying instrument include a distance measuring light projecting module having a light emitting module configured to project a distance measuring light to an object and a one-dimensional diffusion optical member configured to diffuse the distance measuring light in a one-dimensional direction, a distance measuring light receiving module having a photodetector configured to receive a reflected distance measuring light from the object, and an arithmetic control module configured to control the light emitting module and calculate a distance to the object based on a light reception result of the reflected distance measuring light with respect to the photodetector, wherein the light emitting module has at least two light emitters laminated in one direction, and the one-dimensional diffusion optical member is configured to diffuse the distance measuring light in a laminating direction of the light emitters.


Find Patent Forward Citations

Yuasa, Taichi. (2026). Surveying instrument (U.S. Patent No. 12774886). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12774886

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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