The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Sep. 19, 2022
Applicant:

Huawei Technologies Co., Ltd., Shenzhen, CN;

Inventors:

Haifeng Yu, Beijing, CN;

Lei Chen, Beijing, CN;

Bingzhao Li, Beijing, CN;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/10 (2009.01);
U.S. Cl.
CPC ...
H04W 24/10 (2013.01);
Abstract

A method for determining cell quality information and an apparatus are provided. The method includes: A terminal device receives first information from a first network device, where the first information indicates that a first cell is associated with a first SSB and a second SSB, and frequency information of the first SSB is different from frequency information of the second SSB; and the terminal device determines quality information of the first cell based on a measurement value of the first SSB and a measurement value of the second SSB.


Find Patent Forward Citations

Yu, Haifeng. (2026). Method for determining cell quality information and apparatus (U.S. Patent No. 12772085). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12772085

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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