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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12771972 B1

PDFFull Text
Date of Patent:
Oct. 20, 2026

Filed:

May. 11, 2021

Data measurement system and method of presenting measurement data

Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Masafumi Furuta, Kyoto, JP;

Koichi Murata, Kyoto, JP;

Koki Yoshida, Kyoto, JP;

Yasuyuki Uraoka, Kyoto, JP;

Kahori Kise, Kyoto, JP;

Assignee:

SHIMADZU CORPORATION, Kyoto, JP;

Attorney:

Muir Patent Law, PLLC

Primary Examiner:

Aditya S Bhat

Int. Cl.
CPC ...
H04Q 9/04 (2006.01); G01D 9/00 (2006.01);
U.S. Cl.
CPC ...
H04Q 9/04 (2013.01); G01D 9/00 (2013.01);
Abstract

A data measurement system () includes a plurality of measurement apparatuses (), a signal transmitter (), and a data processing apparatus (). The signal transmitter () transmits a trigger signal to the plurality of measurement apparatuses (). The data processing apparatus () obtains from each of the plurality of measurement apparatuses (), measurement data measured during a period between a start signal corresponding to the trigger signal transmitted at first time and an end signal corresponding to the trigger signal transmitted at second time later than the first time. The data processing apparatus () temporally aligns start signals in the obtained data with each other and aligns end signals in the obtained data with each other, and presents the measurement data from the plurality of measurement apparatuses () to a user.

Find Patent Forward Citations

Furuta, Masafumi. (2026). Data measurement system and method of presenting measurement data (U.S. Patent No. 12771972). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12771972

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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