The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

May. 08, 2025
Applicant:

Metrolaser, Inc., Laguna Hills, CA (US);

Inventor:

Jacob George, Downey, CA (US);

Assignee:

METROLASER, INC., Laguna Hills, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 23/68 (2023.01); G01J 9/02 (2006.01); G01J 9/00 (2006.01);
U.S. Cl.
CPC ...
H04N 23/682 (2023.01); G01J 9/02 (2013.01); H04N 23/6811 (2023.01); G01J 2009/002 (2013.01);
Abstract

A system and a method for measuring, correcting, and implementing real-time adjustments for aero-optical effects for vehicle-based optical systems used in high speed or turbulent scenarios are provided. The system and method may include obtaining, via an imaging system, a wavefront measurement of air flow in a high speed or turbulent environment. The imaging system may include a wavefront sensor and optical components within a module and configured for manipulating a laser beam, and an optical window for transmitting the laser beam in-and-out through the optical window (e.g., in a beam director or 'turret'). The imaging system may comprise, outside the module, a reflector or mirror positioned along an optical axis and configured to receive and reflect the laser beam from the optical window. The method may include determining wavefront distortions of the laser beam based on the wavefront measurement and determining optical degradation based on the wavefront distortions.


Find Patent Forward Citations

George, Jacob. (2026). System and method for real-time inflight measurements of aero-optical quantities using an onboard wavefront sensor (U.S. Patent No. 12771937). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12771937

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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