The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

Jun. 12, 2024
Applicant:

Kyocera Document Solutions Inc., Osaka, JP;

Inventor:

Atsushi Kimura, Osaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/193 (2006.01); H04N 1/32 (2006.01);
U.S. Cl.
CPC ...
H04N 1/193 (2013.01); H04N 1/32635 (2013.01); H04N 1/32657 (2013.01); H04N 2201/0081 (2013.01);
Abstract

A plurality of line sensors are disposed along a width direction intersecting a sheet conveying direction with respective positions in the width direction partially overlapping with each other, and configured to read images of a plurality of partial areas from the sheet, each of the partial areas including a non-overlapping area which does not overlap with an adjacent area and an overlapping area which overlaps with an adjacent area, each of which is a part of a sheet passing area in the width direction. An image judgment portion judges whether or not data of each of a plurality of read images obtained by the plurality of line sensors satisfies a tolerance condition based on a corresponding reference image data item. An error processing portion executes predetermined error processing when it is judged that the data of any of the plurality of read images does not satisfy the tolerance condition.


Find Patent Forward Citations

Kimura, Atsushi. (2026). Image forming apparatus (U.S. Patent No. 12771798). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12771798

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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