The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Jun. 18, 2024
Canon Kabushiki Kaisha, Tokyo, JP;
Kimio Hayashi, Tokyo, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A quality inspection system includes an information processing device and an image formation system. The information processing device includes an acquisition unit that acquires information relating to a quality inspection device included in the image formation system; a reception unit that receives information relating to quality inspection to be executed by the quality inspection device; a display unit that displays a quality inspection device for executing quality inspection corresponding to the information being received by the reception unit, based on the information relating to the quality inspection device being acquired by the acquisition unit in a selectable manner by a user; and a transmission unit that transmits, to the image formation system, an instruction for causing the quality inspection device selected by the user to execute the quality inspection.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile