The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Mar. 18, 2022
Nec Corporation, Tokyo, JP;
Ryo Mizushima, Tokyo, JP;
Tomohiko Yagyu, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A measure candidate table includes a plurality of measures and indices indicating the effects of respective measures. A measure compatibility table includes combinations of measures in each of which two or more of the plurality of measures are combined with each other and indies indicating the effects of respective combinations of measures. A measure calculation means plans a measure against an attack used in an attack route by using the measure candidate table and the measure compatibility table. A risk value calculation means calculates, based on an index indicating an effect of a measure and an index indicating an effect of a combination of measures, a risk value of the attack route under an assumption that the planned measure is introduced into a system to be analyzed.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile