The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Jul. 26, 2024
Suzhou Boundless Medical Technology Co., Ltd., Suzhou, CN;
SUZHOU BOUNDLESS MEDICAL TECHNOLOGY CO., LTD., Suzhou, CN;
Abstract
The invention provides a method and system for screening high developmental potential embryo for in-vitro fertilization. The method includes segmenting an embryo from an acquired multi-focus embryo image; segmenting a TE image from the multi-focus embryo image after embryo segmentation, and unfolding the segmented TE image; inputting the multi-focus embryo image after segmentation, the TE image unfolded after the segmentation, the biochemical features of the patient couple and the status features of the maternal uterus into a trained prediction model, and outputting an embryo developmental potential score; and selecting the embryo with the highest score as the high developmental potential embryo. The multi-focus embryo image, the TE image, the biochemical features of the patient couple and the status features of the maternal uterus, are comprehensively considered, and the developmental potential of each embryo is quantified, so that the high developmental potential embryo can be quickly and accurately screened.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile