The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Oct. 23, 2023
Leica Geosystems Ag, Heerbrugg, CH;
Norbert Kotzur, Altstätten, CH;
Markus Geser, Horn, CH;
Bernd Möller, Lüchingen, CH;
Hans-Martin Zogg, Uttwil, CH;
Richard Ostridge, Rebstein, CH;
Hannes Maar, Dornbirn, AT;
Shane O'regan, Heerbrugg, CH;
LEICA GEOSYSTEMS AG, Heerbrugg, CH;
Abstract
A survey instrument comprising a single point and a point cloud measuring functionality, a communication interface, and a computing unit. The point cloud measuring functionality configured to emit a scanning beam along a first measuring axis and to advance the first measuring axis along a scanning pattern. The point cloud measuring functionality is configured to generate point cloud data representing a setting. The single point measuring functionality is configured to emit a measuring beam along a second measuring axis. The first measuring axis is referenced to the second measuring axis. The communication interface is configured to receive model data representing at least a part of the setting and comprising referencing data to an external coordinate system. The computing unit is configured to identify cardinal features in the point cloud data as well as in the model data.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile