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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12770263 B1

PDFFull Text
Date of Patent:
Oct. 20, 2026

Filed:

Dec. 09, 2024

Method and system for health estimation of body implants

Applicant:

Tata Consultancy Services Limited, Mumbai, IN;

Inventors:

Aparna Kanakatte Gurumurthy, Bangalore, IN;

Divya Manoharlal Bhatia, Bangalore, IN;

Rupsha Mukherjee, Kolkata, IN;

Jayavardhana Rama Gubbi Lakshminarasimha, Bangalore, IN;

Murali Poduval, Thane West, IN;

Avik Ghose, Kolkata, IN;

Assignee:

Tata Consultancy Services Limited, Mumbai, IN;

Attorney:

Finnegan, Henderson, Farabow, Garrett & Dunner LLP

Primary Examiner:

Claire X Wang

Int. Cl.
CPC ...
G06T 7/00 (2017.01); A61F 2/32 (2006.01); A61F 2/46 (2006.01); G06T 7/60 (2017.01); G06T 7/73 (2017.01); G06V 10/764 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0016 (2013.01); A61F 2/32 (2013.01); A61F 2/468 (2013.01); G06T 7/60 (2013.01); G06T 7/73 (2017.01); G06V 10/764 (2022.01); G06T 2200/28 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30008 (2013.01); G06V 2201/033 (2022.01);
Abstract

Existing approaches in this domain are targeted to identifying specific anomalies, and there is no system available that determines implant health comprehensively by considering various aspects that may represent health of the implants. The method and system disclosed herein provide an implant health monitoring approach in which by processing an X-ray image received as input, a system identifies location of an implant in body of a subject, and identifies manufacturer and subtype details of the implant. Further, an implant size and implant fixation details are determined. Further, anomaly detection is performed to determine presence of one or more anomalies in the implant, based on the determined manufacturer and subtype details, the determined location of the implant, a determined region around the implant, the implant fixation details, and the implant size information, and accordingly the implant is classified as one of Faulty, Healthy, and Probable faulty.

Find Patent Forward Citations

Kanakatte Gurumurthy, Aparna. (2026). Method and system for health estimation of body implants (U.S. Patent No. 12770263). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12770263

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