The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
Jun. 07, 2023
Hon Hai Precision Industry Co., Ltd., New Taipei City, TW;
Foxconn Technology Group Co., Ltd., Guangdong Province, CN;
Yung-Hui Li, New Taipei City, TW;
Kai-Lin Yang, New Taipei City, TW;
Yi-Rong Lin, New Taipei City, TW;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei City, TW;
Foxconn Technology Group Co., Ltd., Guangdong Province, CN;
Abstract
A defect detecting apparatus and method are provided. The defect detecting apparatus receives an image to be tested. The defect detecting apparatus detects the image to be tested through a defect detecting model to generate an anomaly score corresponding to the image to be tested, and the defect detecting model is generated based on the training of a generative adversarial network and a plurality of normalized loss functions. The defect detecting apparatus compares the anomaly score with an anomaly score threshold to determine whether the image to be tested is a defective image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile