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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12770243 B1

PDFFull Text
Date of Patent:
Oct. 20, 2026

Filed:

Jun. 21, 2024

Module and system for, and method of detecting defects in ultra-thin glass

Applicant:

Samsung Display Co., Ltd., Yongin-Si, KR;

Inventors:

Yunku Kang, Yongin-si, KR;

Sungmin Park, Yongin-si, KR;

Janghoon Lee, Yongin-si, KR;

Leegu Han, Yongin-si, KR;

Assignee:

Samsung Display Co., Ltd., Yongin-si, KR;

Attorney:

Innovation Counsel LLP

Primary Examiner:

Mark R Milia

Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 21/45 (2006.01); G01N 21/88 (2006.01); G01N 21/958 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0008 (2013.01); G01N 21/453 (2013.01); G01N 21/8851 (2013.01); G01N 21/958 (2013.01); G06T 7/0004 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30121 (2013.01);
Abstract

An automatic inspection system for detecting defects in ultra-thin glass is disclosed that includes an edge inspection module for inspecting for chipping and wedge defects caused during laser cutting of the ultra-thin glass into cell units, a surface inspection module for inspecting scratches, cracks, and foreign substances on a surface of the ultra-thin glass, a phase measurement beam deflection (PMD) module for inspecting the surface of the ultra-thin glass for smudges and depressions through phase change measurement, and a Pt-derived ultra-fine defect inspection module for inspecting the ultra-thin glass for Pt-derived ultra-fine defects.

Find Patent Forward Citations

Kang, Yunku. (2026). Module and system for, and method of detecting defects in ultra-thin glass (U.S. Patent No. 12770243). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12770243

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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