The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 20, 2026
Filed:
May. 30, 2024
Fujitsu Limited, Kawasaki, JP;
Vartika Sengar, Bangalore, IN;
Anuj Rathore, Bangalore, IN;
Daksh Thapar, Bangalore, IN;
Parveena Shamim Abdul Salam, Bangalore, IN;
Arkadipta De, Bangalore, IN;
Venkata Ujwal Sai Gujjari, Bangalore, IN;
Fujitsu Limited, Kawasaki, JP;
Abstract
A computer-implemented method comprising: determining a 2D overlapping portion between a source 2D projection of a source 3D point cloud and a target 2D projection of a target 3D point cloud, the 2D overlapping portion corresponding to an overlapping region between the source and target geographical areas; dividing the 2D overlapping portion into a plurality of cells and determining at least one overlap cell which includes at least a threshold number of points from the source 2D projection and at least a threshold number of points from the target 2D projection; performing a comparison process for said overlap cell and selecting a best matching target set; determining a transformation between the points of the source set and the points of the best matching target set or vice versa; and applying the transformation to register the source 3D point cloud to the target 3D point cloud or vice versa.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile