The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 2026

Filed:

May. 18, 2023
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Mitchell Joblin, Surrey, CA;

Dianna Yee, Vancouver, CA;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/901 (2019.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 16/9024 (2019.01); G06F 16/9027 (2019.01);
Abstract

For detecting sensor anomalies, a machine learning model models a material flow in an industrial system, as a hierarchical time series, wherein the hierarchical time series represents a structure of the material flow using a directed acyclic graph with a set of nodes and a set of edges, wherein each node is associated to a time series, and wherein the edges represent parent-child relations where each value of a time series at a parent node equals the sum of the respective values of its child nodes. The machine learning model forecasts predicted time series values for all nodes. Current sensor measurements received from sensors placed in the industrial system are compared to the predictions of the machine learning model. An anomaly is detected if the difference exceeds a threshold.


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Joblin, Mitchell. (2026). Method and system for detecting sensor anomalies (U.S. Patent No. 12770061). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12770061

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