logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 12770025 B1

PDFFull Text
Date of Patent:
Oct. 20, 2026

Filed:

Feb. 11, 2022

Prediction model for predicting product quality parameter values

Applicants:

Thyssenkrupp Uhde Gmbh, Dortmund, DE;

Thyssenkrupp Ag, Essen, DE;

Inventors:

Robert Helterhoff, Berlin, DE;

Heinrich Koch, Kleinmachnow, DE;

Matthias Schoennagel, Berlin, DE;

Christopher Seibel, Essen, DE;

Georg Sieber, Munich, DE;

Mylène Speisser, Berlin, DE;

Sophie Ruoshan Wei, Munich, DE;

Assignees:

thyssenkrupp Uhde GmbH, Dortmund, DE;

thyssenkrupp AG, Essen, DE;

Attorney:

thyssenkrupp North America, LLC

Primary Examiner:

Maher N Algibhah

Int. Cl.
CPC ...
G06N 5/022 (2023.01);
U.S. Cl.
CPC ...
G06N 5/022 (2013.01);
Abstract

A method for training a machine-learning module of a computer-implemented prediction model for predicting product quality parameter values for one or more quality parameters of a chemical product produced by a chemical production plant. The production plant includes a plurality of sensors, each of which is configured to acquire process parameter values for one or more process parameters of a chemical process carried out by the production plant for producing the chemical product during operation of the production plant. A priori information about the production plant and the process carried out by the production plant is used, including chronological sequence information about a chronological sequence of the process carried out within the production plant, for which sensors sensor-specific time shifts between an acquisition time of training process parameter values and a production time of a product unit, during the production of which the corresponding training process parameter value was acquired.

Find Patent Forward Citations

Helterhoff, Robert. (2026). Prediction model for predicting product quality parameter values (U.S. Patent No. 12770025). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12770025

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…